Electron Microscopy For Beginners
- Basics of Scanning Electron Microscopy: Secondary Electron and BSE imaging mode
- Feature Size measurement: Porosity, Grain, and Reinforcement
- Effect of Beam voltage on conducting and insulating samples
- Elemental mapping: Spot, Line and Area Analysis
- Basic operations of Transmission Electron Microscope (Imaging and Diffraction Pattern)
- Bright Field Imaging and Dark Field Imaging
- Electron Diffraction for various materials
- Indexing of Diffraction Patterns (Ring Pattern & Spot Pattern)
- Sample Preparation for TEM analysis (Bulk metal, Powder sample, Brittle material)
- Cross-sectional Sample Preparation